A Bare-chip Probe for High I/O, High Speed Testing. Hawlett Packard Probing High Power Logic Die at Sort. Intel Signal Integrity Simultaneous Switch Noise and Power Plane Bounce for CMOS Technology, Sun Microsystems
Signal Integrity
Simultaneous Switch Noise and Power Plane Bounce for CMOS Technology, Sun Microsystems
A Bare-chip Probe for High I/O, High Speed Testing. Hawlett Packard
Probing High Power Logic Die at Sort. Intel
Signal Integrity
Simultaneous Switch Noise and Power Plane Bounce for CMOS Technology, Sun Microsystems