Department
of Computer Enginnering
University
of Maryland at Baltimore County
Mission
The International Technology Roadmap for Semiconductors
identifies a need for innovative testing and diagnostic methods for digital
and mixed-signal devices. Traditional testing strategies are becoming less
effective for several reasons. As device operational frequencies increase,
the cost of functional test equipment, capable of testing devices at their
native speed (at-speed), is becoming cost prohibitive. Testing methods
which use slower, cheaper test equipment need to be able to detect defects
that cause at-speed delay failures. The increasing complexity and diversity
of these devices also make it difficult to access internal nodes and achieve
good fault coverage. Technology trends, such as increases in device
leakage currents, have reduced the effectiveness of alternative tests such
as IDDQ. This research is designed to address these short-coming by investigating
device transient and novel quiescent signal techniques.
People
Dr.
James F. Plusquellic (plusquel@csee.umbc.edu)
Chintal
Patel (cpatel2@csee.umbc.edu)
Abhishek
Singh (abhishek@csee.umbc.edu)
Sanat
Kamal Bahl (skamal2@csee.umbc.edu)
Smita
Pawar (psmita1@csee.umbc.edu)
Dhruva
Jyoti Acharyya (adhruva1@csee.umbc.edu)
New Students for FALL 2002
Pushkar Pulastya
Tushar Chaubal
Mikhail Itshovich
Funding
IBM
ACAS Faculty Partnership Research Grant
National Science
Foundation (NSF)
Equipment Contributions
Intel Corporation
Agilent Technologies
Xilinx
Site maintained
by: Smita Pawar : psmita1@csee.umbc.edu